<http://experiment.worldcat.org/entity/person/data/2660762838.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Person> .
<http://experiment.worldcat.org/entity/person/data/2660762838.nt> <http://schema.org/about> <http://worldcat.org/entity/person/id/2660762838> .
<http://worldcat.org/entity/person/id/2660762838> <http://schema.org/additionalName> "DATA PROCESSING--ANALYSIS OF" .
<http://worldcat.org/entity/person/id/2660762838> <http://schema.org/familyName> "VARIANCE" .
<http://worldcat.org/entity/person/id/2660762838> <http://schema.org/givenName> "ELECTRONIC" .
<http://worldcat.org/entity/person/id/2660762838> <http://schema.org/name> "ELECTRONIC DATA PROCESSING--ANALYSIS OF VARIANCE" .
<http://worldcat.org/entity/person/id/2660762838> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Person> .