<http://experiment.worldcat.org/entity/work/data/103940287.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/103940287.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/103940287> .
<http://worldcat.org/entity/work/id/103940287> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/103940287> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Periodical_literature> .
<http://worldcat.org/entity/work/id/103940287> <http://schema.org/workExample> <http://www.worldcat.org/oclc/150351193> .
<http://worldcat.org/entity/work/id/103940287> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/103940287#Organization/ieee_computer_society> .
<http://worldcat.org/entity/work/id/103940287> <http://schema.org/name> "... IEEE VSLI test symposium" .
<http://experiment.worldcat.org/entity/work/data/103940287#Organization/ieee_computer_society> <http://schema.org/name> "IEEE Computer Society." .
<http://experiment.worldcat.org/entity/work/data/103940287#Organization/ieee_computer_society> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Organization> .