"Materials Science." . . "Materials science." . "Engineering." . . "Chimie." . . "Rasterkraftmikroskopie." . . "Surfaces and Interfaces, Thin Films." . . "Surfaces and Interfaces, Thin Films" . "Thermodynamics." . . "Atomic force microscopy." . . "Kelvin-Sonde." . . "Kelvin-Sonde" . "Science des matériaux." . . "Microscopie électronique à balayage." . . "Kraftmikroskopie." . . "Kraftmikroskopie" . "Engineering Thermodynamics, Heat and Mass Transfer." . . "Engineering Thermodynamics, Heat and Mass Transfer" . "Surfaces (Physics)" . . "Surfaces (physique)." . . "Electrostatics Measurement." . . "Microscopy." . . . . "Microscopie à force atomique." . . . . . . . . . . . . . . . . . . . "Kelvin probe force microscopy measuring and compensating electrostatic forces"@en . "Kelvin probe force microscopy measuring and compensating electrostatic forces" . . . . . . . . "Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces"@en . "Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces" . . . . "Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces" . . . . . . . . . . . . . . . . . "Kelvin probe force microscopy : measuring and compensating electrostatic forces"@en . . "Kelvin probe force microscopy : measuring and compensating electrostatic forces" . . "Electronic books"@en . "Electronic books" . . "Kelvin Probe Force Microscopy"@en . "In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert." . "In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert."@en . . . . . . . "Électrostatique Mesure." . .