ITC International Test Conference 2006 proceedings : October 24-October 26, 2006, Santa Clara Convention Center, Santa Clara, California USA

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/CreativeWork
http://schema.org/Book

http://schema.org/about

http://experiment.worldcat.org/entity/work/data/105139477#Topic/radiofrequences_congres
http://id.worldcat.org/fast/1032639
http://experiment.worldcat.org/entity/work/data/105139477#Topic/ordinateurs_congres
http://experiment.worldcat.org/entity/work/data/105139477#Topic/telecommunications_congres
http://id.loc.gov/authorities/subjects/sh2008104739
http://experiment.worldcat.org/entity/work/data/105139477#Topic/circuits_integres_congres
http://id.worldcat.org/fast/907134
http://id.worldcat.org/fast/1145830
http://id.loc.gov/authorities/subjects/sh2010109344
http://experiment.worldcat.org/entity/work/data/105139477#Topic/semiconducteurs_congres
http://id.loc.gov/authorities/subjects/sh2009124810
http://experiment.worldcat.org/entity/work/data/105139477#Topic/circuits_integres_verification_congres
http://experiment.worldcat.org/entity/work/data/105139477#Topic/logiciels_verification_congres
http://id.worldcat.org/fast/1087309
http://id.loc.gov/authorities/subjects/sh2008108196
http://id.loc.gov/authorities/subjects/sh2008112721
http://id.worldcat.org/fast/975593

http://schema.org/alternateName

"International Test Conference 2006"@en
"International Test Conference 2006"
"Test Conference, 2006. ITC '06. IEEE International"
"ITC '06"

http://schema.org/contributor

http://viaf.org/viaf/125147174
http://id.loc.gov/authorities/names/n79053217
http://viaf.org/viaf/123926298
http://id.loc.gov/authorities/names/n88164000
http://viaf.org/viaf/151378625
http://id.loc.gov/authorities/names/n80056672

http://schema.org/creator

http://experiment.worldcat.org/entity/work/data/105139477#Meeting/international_test_conference_37e_2006_santa_clara_calif
http://experiment.worldcat.org/entity/work/data/105139477#Meeting/international_test_conference_2006_santa_clara_calif

http://schema.org/name

"Test Conference, 2006. ITC '06. IEEE International"
"ITC International Test Conference 2006 proceedings : October 24-October 26, 2006, Santa Clara Convention Center, Santa Clara, California USA"@en
"ITC International Test Conference 2006 proceedings : October 24-October 26, 2006, Santa Clara Convention Center, Santa Clara, California USA"

http://schema.org/workExample

http://www.worldcat.org/oclc/756545332
http://www.worldcat.org/oclc/156956326
http://www.worldcat.org/oclc/701602428

International Test Conference (2006 : Santa Clara, Calif.)

This is a placeholder reference for a Meeting entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"International Test Conference (2006 : Santa Clara, Calif.)"

http://experiment.worldcat.org/entity/work/data/105139477#Meeting/international_test_conference_2006_santa_clara_calif

International Test Conference (37e : 2006 : Santa Clara, Calif.)

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"International Test Conference (37e : 2006 : Santa Clara, Calif.)"

http://experiment.worldcat.org/entity/work/data/105139477#Meeting/international_test_conference_37e_2006_santa_clara_calif

Circuits intégrés Congrès.

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Circuits intégrés Congrès."