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<http://experiment.worldcat.org/entity/work/data/1086970926.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
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<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/contributor> <http://viaf.org/viaf/138665955> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.worldcat.org/fast/1108895> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/genre> "Electronic texts"@en .
<http://worldcat.org/entity/work/id/1086970926> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1086970926#Topic/career_mobility> .
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<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2630528621> .
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<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85118696> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.worldcat.org/fast/1204155> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/name> "International mobility of scientists and engineers to the United States : brain drain or brain circulation?" .
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<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/no94023305> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008119511> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85016366> .
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<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.worldcat.org/fast/910649> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/contributor> <http://viaf.org/viaf/157365449> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2010112281> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.worldcat.org/fast/1043220> .
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<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/name> "International mobility of scientists and engineers of the United States : brain drain or brain circulation?"@en .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/workExample> <http://www.worldcat.org/oclc/779733310> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008108567> .
<http://worldcat.org/entity/work/id/1086970926> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79005681> .
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<http://experiment.worldcat.org/entity/work/data/1086970926#Place/united_states> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Place> .
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<http://experiment.worldcat.org/entity/work/data/1086970926#Topic/transients_and_migrants> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .