<http://worldcat.org/entity/work/id/1104103863> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7_1997_09_07_10_templin_germany> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/workExample> <http://www.worldcat.org/oclc/245840253> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/genre> "Conference proceedings" .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1104103863#Topic/image_traitement_des_congres> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7th_1997_templin_germany> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008111512> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008104259> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/name> "Defect recognition and image processing in semiconductors 1997 : proceedings of the seventh International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7 - 10 September, 1997" .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://id.worldcat.org/fast/967501> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/workExample> <http://www.worldcat.org/oclc/474781274> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85064446> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/name> "Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997" .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2628426063> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85119908> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://id.worldcat.org/fast/1112211> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/genre> "Conference papers and proceedings" .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2632005774> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/workExample> <http://www.worldcat.org/oclc/38130571> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1104103863#Topic/semiconducteurs_defauts_congres> .
<http://worldcat.org/entity/work/id/1104103863> <http://schema.org/name> "Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997" .
<http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7_1997_09_07_10_templin_germany> <http://schema.org/name> "International Conference on Defect Recognition and Image Processing in Semiconductors (7 : 1997.09.07-10 : Templin, Germany)" .
<http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7_1997_09_07_10_templin_germany> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7_1997_09_07_10_templin_germany> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/1104103863.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/1104103863.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/1104103863> .
<http://experiment.worldcat.org/entity/work/data/1104103863#Topic/image_traitement_des_congres> <http://schema.org/name> "Image, Traitement des Congrès." .
<http://experiment.worldcat.org/entity/work/data/1104103863#Topic/image_traitement_des_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7th_1997_templin_germany> <http://schema.org/name> "International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, Germany)" .
<http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7th_1997_templin_germany> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/1104103863#Meeting/international_conference_on_defect_recognition_and_image_processing_in_semiconductors_7th_1997_templin_germany> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/1104103863#Topic/semiconducteurs_defauts_congres> <http://schema.org/name> "Semiconducteurs Défauts Congrès." .
<http://experiment.worldcat.org/entity/work/data/1104103863#Topic/semiconducteurs_defauts_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .