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http://worldcat.org/entity/work/id/1108247099

Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction)

This study was initiated to i\536 instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters.

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http://schema.org/alternateName

  • "Instrumemtation and measurement of index of refraction"@en

http://schema.org/description

  • "This study was initiated to i\536 instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters."@en

http://schema.org/name

  • "Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction)"@en