Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction)
This study was initiated to i\536 instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters.
"This study was initiated to i\536 instrument a system and to make measurements of the complex index of refraction in the wavelength region between 0.1 to 1.0 millimeters."@en
Catholic University of America. Department of Electrical Engineering,
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United States. National Aeronautics and Space Administration,
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