Linked Data Explorerhttp://worldcat.org/entity/work/id/11166772
ESD in silicon integrated circuits
Open All Close All
http://schema.org/about
- http://id.loc.gov/authorities/subjects/sh85127548
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/integrierte_schaltung
- http://id.worldcat.org/fast/1112246
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/elektrostatik_teknisk
- http://id.worldcat.org/fast/907767
- http://id.loc.gov/authorities/subjects/sh85119903
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/circuits_integrats
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/integrerede_kredse
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/circuits_integres_protection
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/palidelighed
- http://id.loc.gov/authorities/subjects/sh85042463
- http://id.worldcat.org/fast/1132020
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/statisk_elektricitet
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/antistatiques
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/semiconducteurs_protection
- http://id.worldcat.org/fast/975587
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/circuitos_integrados
- http://id.loc.gov/authorities/subjects/sh85067117
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/elektrostatische_entladung
- http://id.worldcat.org/fast/1112198
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/electronic_books
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/descarregues_electriques
- http://experiment.worldcat.org/entity/work/data/11166772#Topic/electrostatique
http://schema.org/alternateName
- "Electrostatic discharge in silicon integrated circuits"
- "Electrostatic Discharge in silicon integrated circuits"
- "Electrostatic Discharge in silicon integrated circuits"@en
http://schema.org/contributor
- http://worldcat.org/entity/person/id/2640499119
- http://worldcat.org/entity/person/id/2730567597
- http://experiment.worldcat.org/entity/work/data/11166772#Thing/amerasekera_e_a
- http://viaf.org/viaf/140991175
- http://worldcat.org/entity/person/id/2640306425
- http://id.loc.gov/authorities/names/no00037213
- http://worldcat.org/entity/person/id/2648370312
- http://worldcat.org/entity/person/id/2730775436
http://schema.org/description
- "Electrostatic discharge (ESD) effects in silicon integrated circuits have become a major concern as high circuit density technologies shrink to sub-micron dimensions. This update of a classic reference provides a complete and current overview of ESD and its implications in the design and development of new semiconductor technologies and integrated circuits."
http://schema.org/genre
- "Electronic books"
http://schema.org/name
- "ESD in silicon integrated circuits"
- "ESD in silicon integrated circuits"@en
- "ESD in Silicon Integrated Circuits"
http://schema.org/workExample
- http://www.worldcat.org/oclc/423817396
- http://www.worldcat.org/oclc/246078911
- http://www.worldcat.org/oclc/248358662
- http://www.worldcat.org/oclc/472841305
- http://www.worldcat.org/oclc/53468482
- http://www.worldcat.org/oclc/624433764
- http://www.worldcat.org/oclc/876713182
- http://www.worldcat.org/oclc/824553377
- http://www.worldcat.org/oclc/762041990
- http://www.worldcat.org/oclc/634218771
- http://www.worldcat.org/oclc/802747491
- http://www.worldcat.org/oclc/439290416
- http://www.worldcat.org/oclc/633124846
- http://www.worldcat.org/oclc/32133336
- http://www.worldcat.org/oclc/832590696
- http://www.worldcat.org/oclc/839260678
- http://www.worldcat.org/oclc/473335414
- http://www.worldcat.org/oclc/48109807
- http://www.worldcat.org/oclc/849910811