Conference proceedings IMTC/94 : advanced technologies in I & M ; Grand Hotel Hamamatsu, Hamamatsu, Japan, May 10-12, 1994

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/Book
http://schema.org/CreativeWork

http://schema.org/about

http://experiment.worldcat.org/entity/work/data/1151518602#Topic/appareil_electronique
http://id.loc.gov/authorities/subjects/sh85043176
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/mesure_instruments_de_technologie_congres
http://id.worldcat.org/fast/910375
http://id.worldcat.org/fast/907299
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/mesure_congres
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/appareils_electroniques_congres
http://id.worldcat.org/fast/907353
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/ingenierie_congres
http://id.loc.gov/authorities/subjects/sh2008102886
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/mesure_instruments_congres
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/instrumentation_congres
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/instrument_de_mesure
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/mesures_electroniques_congres
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/instrumentation
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/ingenierie
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/mesure_electronique
http://id.worldcat.org/fast/910572
http://id.loc.gov/authorities/subjects/sh2008119318
http://id.loc.gov/authorities/subjects/sh2008102946
http://experiment.worldcat.org/entity/work/data/1151518602#Topic/capteurs_technologie_congres

http://schema.org/alternateName

"1994 IEEE Instrumentation and Measurement Technology Conference"@en
"Instrumentation and Measurement Technology Conference, 1994, IMTC/94, conference proceedings, 10th Anniversary, Advanced Technologies in I & M, 1994 IEEE"@en
"IMTC 94"@en
"Advanced technologies in I & M"@en

http://schema.org/contributor

http://id.loc.gov/authorities/names/n79053217
http://experiment.worldcat.org/entity/work/data/1151518602#Organization/keisoku_jido_seigyo_gakkai_japon
http://viaf.org/viaf/169125610
http://viaf.org/viaf/137131892
http://viaf.org/viaf/123926298
http://id.loc.gov/authorities/names/n78043430
http://id.loc.gov/authorities/names/n82086664

http://schema.org/creator

http://experiment.worldcat.org/entity/work/data/1151518602#Meeting/ieee_instrumentation_and_measurement_technology_conference_1994_hamamatsu_shi_japan
http://experiment.worldcat.org/entity/work/data/1151518602#Meeting/ieee_instrumentation_and_measurement_technology_conference_11e_1994_hamamatsu_shi_japon

http://schema.org/genre

"Ressource Internet (Descripteur de forme)"
"Conference papers and proceedings"@en

http://schema.org/name

"Conference proceedings IMTC/94 : advanced technologies in I & M ; Grand Hotel Hamamatsu, Hamamatsu, Japan, May 10-12, 1994"@en
"Conference proceedings IMTC/94 : advanced technologies in I & M"@en
"Conference proceedings : IMTC/94 : advanced technologies in I & M"@en
"IMTC/94 conference proceedings : advanced technologies in I & M : Grand Hotel Hamamatsu, Hamamatsu, Japan, May 10-12, 1994"

http://schema.org/workExample

http://www.worldcat.org/oclc/31689914
http://www.worldcat.org/oclc/32695328
http://www.worldcat.org/oclc/747316539
http://www.worldcat.org/oclc/761807823
http://www.worldcat.org/oclc/326204664
http://www.worldcat.org/oclc/232342222

IEEE Instrumentation and Measurement Technology Conference (11e : 1994 : Hamamatsu-shi, Japon)

This is a placeholder reference for a Meeting entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"IEEE Instrumentation and Measurement Technology Conference (11e : 1994 : Hamamatsu-shi, Japon)"

http://experiment.worldcat.org/entity/work/data/1151518602#Meeting/ieee_instrumentation_and_measurement_technology_conference_11e_1994_hamamatsu_shi_japon

IEEE Instrumentation and Measurement Technology Conference (1994 : Hamamatsu-shi, Japan)

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"IEEE Instrumentation and Measurement Technology Conference (1994 : Hamamatsu-shi, Japan)"

http://experiment.worldcat.org/entity/work/data/1151518602#Meeting/ieee_instrumentation_and_measurement_technology_conference_1994_hamamatsu_shi_japan

Keisoku Jidō Seigyo Gakkai (Japon)

This is a placeholder reference for a Organization entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Organization
schema:name
"Keisoku Jidō Seigyo Gakkai (Japon)"

http://experiment.worldcat.org/entity/work/data/1151518602#Organization/keisoku_jido_seigyo_gakkai_japon

Appareil électronique.

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Appareil électronique."