<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ordinateurs_essais_congres> <http://schema.org/name> "Ordinateurs Essais Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ordinateurs_essais_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/test_integre> <http://schema.org/name> "Test intégré." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/test_integre> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ingenierie_des_systemes_congres> <http://schema.org/name> "Ingénierie des systèmes Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ingenierie_des_systemes_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_d_armes_innovations_congres> <http://schema.org/name> "Systèmes d'armes Innovations Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_d_armes_innovations_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_experts_flous_congres> <http://schema.org/name> "Systèmes experts flous Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_experts_flous_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Organization/institute_of_electrical_and_electronics_engineers> <http://schema.org/name> "Institute of Electrical and Electronics Engineers." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Organization/institute_of_electrical_and_electronics_engineers> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Organization> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Organization/institute_of_electrical_and_electronics_engineers> <http://schema.org/name> "Institute of Electrical and Electronics Engineers" .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/genie_logiciel_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/contributor> <http://viaf.org/viaf/123926298> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/name> "1999 IEEE Autotestcon proceedings Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999"@en .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85145837> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://id.worldcat.org/fast/907175> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/verification_de_logiciels> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/intelligence_artificielle_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/detection_de_defaut_ingenierie_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/workExample> <http://www.worldcat.org/oclc/652381754> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/workExample> <http://www.worldcat.org/oclc/423944022> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_automatisee_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_d_armes_innovations_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_experts_informatique_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85042314> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/genre> "Conference papers and proceedings"@en .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/test_integre> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/1151553378#Meeting/autotestcon_1999_san_antonio_tex> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/alternateName> "1999 IEEE Autotestcon"@en .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/workExample> <http://www.worldcat.org/oclc/42896194> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ordinateurs_essais_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/name> "AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE" .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://id.worldcat.org/fast/1141455> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/essais_technologie_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/ingenierie_des_systemes_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79053217> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/1151553378#Organization/institute_of_electrical_and_electronics_engineers> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/name> "Autotestcon 99 1999 IEEE Autotestcon proceedings : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999" .
<http://worldcat.org/entity/work/id/1151553378> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/workExample> <http://www.worldcat.org/oclc/756609198> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_assistee_par_ordinateur> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://id.worldcat.org/fast/1173071> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systeme_a_base_de_connaissances> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/name> "1999 IEEE Autotestcon proceedings : Autotestcon '99 : IEEE Systems Readiness Technology Conference : Test technology for the new millennium : August 30-September 2, 1999"@en .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/alternateName> "AUTOTESTCON '99, IEEE Systems Readiness Technology Conference, 1999, IEEE"@en .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/workExample> <http://www.worldcat.org/oclc/47881501> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008111998> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/alternateName> "IEEE Systems Readiness Technology Conference"@en .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/alternateName> "Test technology for the new millennium"@en .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/genre> "Ressource Internet (Descripteur de forme)" .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_experts_flous_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/armes_systemes_d_innovations_congres> .
<http://worldcat.org/entity/work/id/1151553378> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1151553378#Topic/equipement_d_essai_automatique_congres> .
<http://experiment.worldcat.org/entity/work/data/1151553378.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/1151553378.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/1151553378> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systeme_a_base_de_connaissances> <http://schema.org/name> "Système à base de connaissances." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systeme_a_base_de_connaissances> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_experts_informatique_congres> <http://schema.org/name> "Systèmes experts (Informatique) Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/systemes_experts_informatique_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/verification_de_logiciels> <http://schema.org/name> "Vérification de logiciels." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/verification_de_logiciels> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/detection_de_defaut_ingenierie_congres> <http://schema.org/name> "Détection de défaut (Ingénierie) Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/detection_de_defaut_ingenierie_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/equipement_d_essai_automatique_congres> <http://schema.org/name> "Équipement d'essai automatique Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/equipement_d_essai_automatique_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Meeting/autotestcon_1999_san_antonio_tex> <http://schema.org/name> "Autotestcon (1999 : San Antonio, Tex.)" .
<http://experiment.worldcat.org/entity/work/data/1151553378#Meeting/autotestcon_1999_san_antonio_tex> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Meeting/autotestcon_1999_san_antonio_tex> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/intelligence_artificielle_congres> <http://schema.org/name> "Intelligence artificielle Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/intelligence_artificielle_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/genie_logiciel_congres> <http://schema.org/name> "Génie logiciel Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/genie_logiciel_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/essais_technologie_congres> <http://schema.org/name> "Essais (technologie) Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/essais_technologie_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/armes_systemes_d_innovations_congres> <http://schema.org/name> "Armes, Systèmes d' Innovations Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/armes_systemes_d_innovations_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_automatisee_congres> <http://schema.org/name> "Maintenance automatisée Congrès." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_automatisee_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_assistee_par_ordinateur> <http://schema.org/name> "Maintenance assistée par ordinateur." .
<http://experiment.worldcat.org/entity/work/data/1151553378#Topic/maintenance_assistee_par_ordinateur> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .