<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/about> <http://id.worldcat.org/fast/822702> .
<http://worldcat.org/entity/work/id/1152594570> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/name> "2005 IEEE International Conference on Control Applications" .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/about> <http://id.worldcat.org/fast/906928> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/alternateName> "2005 CCA"@en .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/name> "2005 IEEE international conference on control applications (CCA)"@en .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/workExample> <http://www.worldcat.org/oclc/796209293> .
<http://worldcat.org/entity/work/id/1152594570> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008119298> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79053217> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/name> "2005 IEEE International Conference on Control Applications (CCA) Toronto, ON, Canada, 28-31 August 2005"@en .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/workExample> <http://www.worldcat.org/oclc/62314273> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/workExample> <http://www.worldcat.org/oclc/62260109> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_conference_on_control_applications> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_international_conference_on_control_applications_2005_toronto_ont> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/alternateName> "CCA 2005"@en .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2007100583> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/1152594570#Organization/institute_of_electrical_and_electronics_engineers_new_york_n_y> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/name> "2005 IEEE International Conference on Control Applications (CCA) : Toronto, ON, Canada, 28-31 August 2005"@en .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/genre> "Conference papers and proceedings"@en .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/contributor> <http://viaf.org/viaf/123926298> .
<http://worldcat.org/entity/work/id/1152594570> <http://schema.org/workExample> <http://www.worldcat.org/oclc/636505298> .
<http://experiment.worldcat.org/entity/work/data/1152594570#Organization/institute_of_electrical_and_electronics_engineers_new_york_n_y> <http://schema.org/name> "Institute of Electrical and Electronics Engineers (New York, N.Y.)" .
<http://experiment.worldcat.org/entity/work/data/1152594570#Organization/institute_of_electrical_and_electronics_engineers_new_york_n_y> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Organization> .
<http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_conference_on_control_applications> <http://schema.org/name> "IEEE Conference on Control Applications." .
<http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_conference_on_control_applications> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_conference_on_control_applications> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/1152594570.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/1152594570.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/1152594570> .
<http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_international_conference_on_control_applications_2005_toronto_ont> <http://schema.org/name> "IEEE International Conference on Control Applications (2005 : Toronto, Ont.)" .
<http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_international_conference_on_control_applications_2005_toronto_ont> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/1152594570#Meeting/ieee_international_conference_on_control_applications_2005_toronto_ont> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .