IEEE standard for Automatic Test Markup Language (ATML) for exchanging automatic test information via XML : exchanging test station information
Abstract: An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test. Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup Language (ATML), automatic test system (ATS), IEEE 1671.6, test station, XML schema.
"Abstract: An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test. Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup Language (ATML), automatic test system (ATS), IEEE 1671.6, test station, XML schema."@en
"Abstract: An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used as a component of a test program set to test and diagnose a unit under test. Keywords: ATML instance document, automatic test equipment (ATE), Automatic Test Markup Language (ATML), automatic test system (ATS), test station, XML schema."@en
"IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information Via XML Exchanging Test Station Information"
"IEEE standard for Automatic Test Markup Language (ATML) for exchanging automatic test information via XML : exchanging test station information"@en
"IEEE trial-use standard for Automatic Test Markup Language (ATML) for exchanging automatic test information via XML exchanging test station information"@en
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IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.
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Institute of Electrical and Electronics Engineers.
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Electronic apparatus and appliances Testing Data processing Standards.
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This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.