<http://experiment.worldcat.org/entity/work/data/1171881025#Topic/semiconductors> <http://schema.org/name> "Semiconductors" .
<http://experiment.worldcat.org/entity/work/data/1171881025#Topic/semiconductors> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/1171881025.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/1171881025.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/1171881025> .
<http://experiment.worldcat.org/entity/work/data/1171881025#Organization/ieee_components_hybrids_and_manufacturing_technology> <http://schema.org/name> "IEEE, Components, Hybrids and Manufacturing Technology" .
<http://experiment.worldcat.org/entity/work/data/1171881025#Organization/ieee_components_hybrids_and_manufacturing_technology> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Organization> .
<http://worldcat.org/entity/work/id/1171881025> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1171881025> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/1171881025> <http://schema.org/workExample> <http://www.worldcat.org/oclc/812617557> .
<http://worldcat.org/entity/work/id/1171881025> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/1171881025#Organization/ieee_components_hybrids_and_manufacturing_technology> .
<http://worldcat.org/entity/work/id/1171881025> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1171881025#Topic/semiconductors> .
<http://worldcat.org/entity/work/id/1171881025> <http://schema.org/name> "IEEE Ninth Annual Semiconductor Thermal Measurement and Management Symposium, 1993" .