<http://experiment.worldcat.org/entity/work/data/1171929277#Organization/ieee_computer_society_staff> <http://schema.org/name> "IEEE Computer Society Staff" .
<http://experiment.worldcat.org/entity/work/data/1171929277#Organization/ieee_computer_society_staff> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Organization> .
<http://experiment.worldcat.org/entity/work/data/1171929277.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/1171929277.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/1171929277> .
<http://worldcat.org/entity/work/id/1171929277> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1171929277> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/1171929277> <http://schema.org/workExample> <http://www.worldcat.org/oclc/812656854> .
<http://worldcat.org/entity/work/id/1171929277> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/1171929277#Organization/ieee_computer_society_staff> .
<http://worldcat.org/entity/work/id/1171929277> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/1171929277#Topic/integrated_circuits_very_large_scale_integration> .
<http://worldcat.org/entity/work/id/1171929277> <http://schema.org/name> "VLSI Test Symposium (VTS 2000) 18th IEEE" .
<http://experiment.worldcat.org/entity/work/data/1171929277#Topic/integrated_circuits_very_large_scale_integration> <http://schema.org/name> "Integrated Circuits Very Large Scale Integration" .
<http://experiment.worldcat.org/entity/work/data/1171929277#Topic/integrated_circuits_very_large_scale_integration> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .