Linked Data Explorer

Turtle N-Triple JSON-LD RDF/XML HTML Contact Us Home

http://worldcat.org/entity/work/id/12379650

ATS 2003 12th Asian Test Symposium : proceedings : 16-190 November, 2003, Xiʻan, China

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/CreativeWork
http://schema.org/Book

http://schema.org/about

http://experiment.worldcat.org/entity/work/data/12379650#Topic/tolerance_aux_fautes_informatique_congres
http://id.worldcat.org/fast/907134
http://id.loc.gov/authorities/subjects/sh2009124810
http://id.worldcat.org/fast/921988
http://experiment.worldcat.org/entity/work/data/12379650#Topic/circuits_electroniques_essais_congres
http://id.worldcat.org/fast/906898
http://id.loc.gov/authorities/subjects/sh2008103617
http://id.loc.gov/authorities/subjects/sh85042282
http://experiment.worldcat.org/entity/work/data/12379650#Topic/ordinateurs_circuits_essais_congres

http://schema.org/alternateName

"Proceedings, 12th Asian Test Symposium"
"Proceedings, 12th Asian Test Symposium"@en
"12th Asian Test Symposium"
"12th Asian Test Symposium"@en

http://schema.org/contributor

http://viaf.org/viaf/151378625
http://id.loc.gov/authorities/names/n79053217
http://id.loc.gov/authorities/names/no92021570
http://viaf.org/viaf/127803337
http://experiment.worldcat.org/entity/work/data/12379650#Organization/guo_jia_zi_ran_ke_xue_ji_jin_wei_yuan_hui_chine
http://id.loc.gov/authorities/names/n00004616
http://viaf.org/viaf/123926298
http://id.loc.gov/authorities/names/no2015084860
http://id.loc.gov/authorities/names/n88164000
http://viaf.org/viaf/132370174
http://viaf.org/viaf/126106893
http://experiment.worldcat.org/entity/work/data/12379650#Organization/chinai_joho_tsushin_gakkai_japan_technical_group_on_dependable_computing

http://schema.org/creator

http://experiment.worldcat.org/entity/work/data/12379650#Meeting/asian_test_symposium_12e_2003_xi_an_chine
http://experiment.worldcat.org/entity/work/data/12379650#Meeting/asian_test_symposium_12th_2003_xian_china
http://experiment.worldcat.org/entity/work/data/12379650#Meeting/asian_test_symposium_12th_2003_xi_an_shi_china

http://schema.org/name

"ATS 2003 12th Asian Test Symposium : proceedings : 16-190 November, 2003, Xiʻan, China"
"ATS 2003 12th Asian Test Symposium : proceedings : 16-190 November, 2003, Xiʻan, China"@en
"ATS 2003 : 12th Asian Test Symposium : proceedings : 16-190 November, 2003, Xiʻan, China"@en

http://schema.org/workExample

http://www.worldcat.org/oclc/701601746
http://www.worldcat.org/oclc/53865411
http://www.worldcat.org/oclc/56814694

Asian Test Symposium (12e : 2003 : Xi'an, Chine)

This is a placeholder reference for a Meeting entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"Asian Test Symposium (12e : 2003 : Xi'an, Chine)"

http://experiment.worldcat.org/entity/work/data/12379650#Meeting/asian_test_symposium_12e_2003_xi_an_chine

Asian Test Symposium (12th : 2003 : Xi'an Shi, China)

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"Asian Test Symposium (12th : 2003 : Xi'an Shi, China)"

http://experiment.worldcat.org/entity/work/data/12379650#Meeting/asian_test_symposium_12th_2003_xi_an_shi_china

Asian Test Symposium (12th : 2003 : Xiʻan, China)

rdf:type
http://schema.org/Event
http://www.productontology.org/id/Meeting
schema:name
"Asian Test Symposium (12th : 2003 : Xiʻan, China)"

http://experiment.worldcat.org/entity/work/data/12379650#Meeting/asian_test_symposium_12th_2003_xian_china

Chinai Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing.

This is a placeholder reference for a Organization entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Organization
schema:name
"Chinai Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing."

http://experiment.worldcat.org/entity/work/data/12379650#Organization/chinai_joho_tsushin_gakkai_japan_technical_group_on_dependable_computing

Guo jia zi ran ke xue ji jin wei yuan hui (Chine)

rdf:type
http://schema.org/Organization
schema:name
"Guo jia zi ran ke xue ji jin wei yuan hui (Chine)"

http://experiment.worldcat.org/entity/work/data/12379650#Organization/guo_jia_zi_ran_ke_xue_ji_jin_wei_yuan_hui_chine

Circuits électroniques Essais Congrès.

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Circuits électroniques Essais Congrès."

http://experiment.worldcat.org/entity/work/data/12379650#Topic/circuits_electroniques_essais_congres

Ordinateurs Circuits Essais Congrès.

rdf:type
http://schema.org/Topic
schema:name
"Ordinateurs Circuits Essais Congrès."

http://experiment.worldcat.org/entity/work/data/12379650#Topic/ordinateurs_circuits_essais_congres

Tolérance aux fautes (Informatique) Congrès.

rdf:type
http://schema.org/Topic
schema:name
"Tolérance aux fautes (Informatique) Congrès."

Linked Data Explorer

Turtle N-Triple JSON-LD RDF/XML HTML Contact Us Home

http://worldcat.org/entity/work/id/12379650

ATS 2003 12th Asian Test Symposium : proceedings : 16-190 November, 2003, Xiʻan, China

Open All Close All

type

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

about

http://schema.org/about

alternateName

http://schema.org/alternateName

contributor

http://schema.org/contributor

creator

http://schema.org/creator

genre

http://schema.org/genre

name

http://schema.org/name

workExample

http://schema.org/workExample