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<http://worldcat.org/entity/work/id/137095188> <http://schema.org/workExample> <http://www.worldcat.org/oclc/227362069> .
<http://worldcat.org/entity/work/id/137095188> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/137095188#Organization/trw_space_technology_labs_los_angeles_calif> .
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<http://worldcat.org/entity/work/id/137095188> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/137095188#Topic/circuits> .
<http://worldcat.org/entity/work/id/137095188> <http://schema.org/name> "Circuit design reliability through redundancy"@en .
<http://worldcat.org/entity/work/id/137095188> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/137095188#Topic/bibliographies> .
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<http://worldcat.org/entity/work/id/137095188> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/137095188#Topic/redundant_components> .
<http://worldcat.org/entity/work/id/137095188> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/137095188#Topic/reliability_electronics> .
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<http://experiment.worldcat.org/entity/work/data/137095188#Topic/bibliographies> <http://schema.org/name> "Bibliographies." .
<http://experiment.worldcat.org/entity/work/data/137095188#Topic/bibliographies> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/137095188#Topic/reliability_electronics> <http://schema.org/name> "Reliability(electronics)" .
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<http://experiment.worldcat.org/entity/work/data/137095188#Topic/circuits> <http://schema.org/name> "Circuits." .
<http://experiment.worldcat.org/entity/work/data/137095188#Topic/circuits> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/137095188#Organization/trw_space_technology_labs_los_angeles_calif> <http://schema.org/name> "TRW SPACE TECHNOLOGY LABS LOS ANGELES CALIF." .
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