<http://experiment.worldcat.org/entity/work/data/1383701.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/1383701.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/1383701> .
<http://worldcat.org/entity/work/id/1383701> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2641457864> .
<http://worldcat.org/entity/work/id/1383701> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1383701> <http://schema.org/workExample> <http://www.worldcat.org/oclc/315169> .
<http://worldcat.org/entity/work/id/1383701> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85042269> .
<http://worldcat.org/entity/work/id/1383701> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85042343> .
<http://worldcat.org/entity/work/id/1383701> <http://schema.org/about> <http://id.worldcat.org/fast/906837> .
<http://worldcat.org/entity/work/id/1383701> <http://schema.org/about> <http://id.worldcat.org/fast/907299> .
<http://worldcat.org/entity/work/id/1383701> <http://schema.org/name> "199 electronic test & alignment techniques" .