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<http://experiment.worldcat.org/entity/work/data/14580476.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/14580476> .
<http://worldcat.org/entity/work/id/14580476> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2640230200> .
<http://worldcat.org/entity/work/id/14580476> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/14580476> <http://schema.org/workExample> <http://www.worldcat.org/oclc/4184275> .
<http://worldcat.org/entity/work/id/14580476> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85042269> .
<http://worldcat.org/entity/work/id/14580476> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/14580476#Topic/electron_circuits> .
<http://worldcat.org/entity/work/id/14580476> <http://schema.org/about> <http://id.worldcat.org/fast/906837> .
<http://worldcat.org/entity/work/id/14580476> <http://schema.org/name> "Test equipment circuit manual" .
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<http://experiment.worldcat.org/entity/work/data/14580476#Topic/electron_circuits> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .