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Advances in Imaging and Electron Physics: Volume 128

The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a longchapter of monograph stature on quantitative electron microscopy at theatomic resolution level by scientists from a well-known and verydistinguished Antwerp University Laboratory. This is unique in that thestatistical aspects are explored fully. This is followed by a contributionby A.M. Grigorya.

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  • "Electron emission physics"
  • "Imaging and electron physics"
  • "Imaging and electron physics"@en
  • "Advances in imaging and electron physics"
  • "Cumulative index"@en

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  • "The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a longchapter of monograph stature on quantitative electron microscopy at theatomic resolution level by scientists from a well-known and verydistinguished Antwerp University Laboratory. This is unique in that thestatistical aspects are explored fully. This is followed by a contributionby A.M. Grigorya."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.* Contributions from leading international scholars and industry experts * Discusses hot topic areas and prese."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."@en
  • "Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics a."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry expert."@en
  • "Advances in Imaging and Electron Physics/B> merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.* Contributions from leading international scholars and industry experts."@en
  • "Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."@en
  • "Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."
  • "Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.-Includes grey systems and grey information -Discusses Phase diversity -Recent developments in the imaging of magnetic domains -Explores stochastic deconvolution over groups."@en
  • ""Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This book: Updated with contributions from leading international scholars and industry experts; discusses hot topic areas and presents current and future research trends; and, an invaluable reference and guide for physicists, engineers and mathematicians."
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.* Contributions from leading international scholars and industry experts * Discusses hot topic areas and presen."@en
  • "The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the mat."
  • "The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. Volume 128 concentrates on regularization, a vital aspect of restoration on low voltage scanning electron microscopy. This Book looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations The text bridges the gap between academic researchers and R & D designers by addressing and solving daily issues, which makes this book essential reading."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.-Includes grey systems and grey information-Discusses Phase diversity-Rec."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."
  • ""Advances in Imaging and Electron Physics" merges two long-running serials-"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."
  • "The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. Volume 128 concentrates on regularization, a vital aspect of restoration on low voltage scanning electron microscopy. This Book looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situa."@en
  • "This serial covers the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This volume focuses on the Wien filter, the first charged particle analyzer and focusing device ever used."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts."@en
  • "Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains."@en
  • "Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field."@en
  • "This much needed volume uniquely brings together all previous volumes of this well-known serial. It allows the readers the ability to navigate through the information in all the preceding volumes by using both author and subject indices."
  • "This much needed volume uniquely brings together all previous volumes of this well-known serial. It allows the readers the ability to navigate through the information in all the preceding volumes by using both author and subject indices."@en
  • "Advances in Imaging & Electron Physics merges two long-running serials-- Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy . The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates."@en
  • "Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."@en
  • "The series bridges the gap between academic researchers and R & D designers by addressing and solving daily issues, which makes it essential reading. This volume looks at theory and its application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and electron physics and apply them to realistic practical situations."@en
  • "Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field."@en
  • "Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains."

editor

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  • "Electronic books"
  • "Electronic books"@en
  • "Indexes"@en
  • "Indexes"
  • "Electronic resource"
  • "Electronic resource"@en

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  • "Advances in Imaging and Electron Physics: Volume 128"@en
  • "Advances in imaging and electron physics. . Volume 110"
  • "Advances in imaging and electron physics. Volume 104, Cumulative index"@en
  • "Advances in imaging and electron physics. Volume 104, Cumulative index"
  • "Advances in imaging and electron physics. Volume 183"@en
  • "Advances in imaging and electron physics. Volume 140"@en
  • "Advances in imaging and electron physics. Volume 140"
  • "Advances in imaging and electron physics. Volume 128"@en
  • "Advances in imaging and electron physics. Volume 128"
  • "Advances in imaging and electron physics. . Volume 109"
  • "Advances in imaging and electron physics. . Volume 111"
  • "Advances in imaging and electron physics. Volume 120"@en
  • "Advances in imaging and electron physics. Volume 120"
  • "Advances in imaging and electron physics. Volume 139"
  • "Advances in imaging and electron physics. Volume 139"@en
  • "Advances in Imaging and Electron Physics Volume 109"
  • "Advances in imaging and electron physics. Volume 109"@en
  • "Advances in imaging and electron physics Volume 161"@en
  • "Advances in Imaging and Electron Physics Volume 106"
  • "Advances in Imaging and Electron Physics Advances in Electron Microscopy and Diffraction"@en
  • "Advances in Imaging and Electron Physics: Volume 111"@en
  • "Advances in imaging and electron physics. Volume 111"
  • "Advances in imaging and electron physics. Volume 111"@en
  • "Advances in imaging and electron physics. Volume 161"@en
  • "Advances in imaging and electron physics. Volume 112"
  • "Advances in imaging and electron physics. Volume 112"@en
  • "Advances in imaging and electron physics. . Volume 140"@en
  • "Advances in imaging and electron physics. . Volume 112"
  • "Advances in imaging and electron physics"
  • "Advances in imaging and electron physics"@en
  • "Advances in Imaging and Electron Physics. Vol. One Hundred and Eighty Two"@en
  • "Advances in imaging and electron physics. Volume 135"@en
  • "Advances in imaging and electron physics, 106"
  • "Advances in Imaging and Electron Physics"@en
  • "Advances in Imaging and Electron Physics"
  • "Advances in Imaging and Electron Physics Optics of Charged Particle Analyzers"@en
  • "Advances in imaging and electron physics Volume 139"
  • "Advances in Imaging and Electron Physics, 152"@en
  • "Advances in imaging and electron physics. Volume 136"@en
  • "Advances in imaging and electron physics. Volume 136"
  • "Advances in Imaging and Electron Physics Volume 104, Cumulative Index"
  • "Advances in Imaging and Electron Physics Volume 110"
  • "Advances in imaging and electron physics. . Volume 113"
  • "Advances in imaging and electron physics. Volume 104"@en
  • "Advances in imaging and electron physics. . Volume 106"
  • "Advances in Imaging and Electron Physics Volume 107"
  • "Advances in imaging and electron physics. Volume one hundred and seventy six, The Wien filter"@en
  • "Advances in imaging and electron physics. Volume 107"@en
  • "Advances in imaging and electron physics. . Volume 107"@en
  • "Advances in imaging and electron physics. Volume 107"
  • "Advances in imaging and electron physics. Volume 113"@en
  • "Advances in imaging and electron physics. Volume 113"
  • "Advances in imaging and electron physics. Volume 167"@en
  • "Advances in imaging and electron physics. Volume 117"@en
  • "Advances in Imaging and Electron Physics Dogma of the Continuum and the Calculus of Finite Differences in Quantum Physics"@en
  • "Advances in imaging and electron physics. Volume 118"@en
  • "Advances in imaging and electron physics. Volume 110"@en

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