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http://worldcat.org/entity/work/id/1654767237
Simulation-based analysis for NBTI degradation in combinational CMOS VLSI circuits
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http://worldcat.org/entity/person/id/2649305369
creator
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http://worldcat.org/entity/person/id/2649305369
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Simulation-based analysis for NBTI degradation in combinational CMOS VLSI circuits
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http://www.worldcat.org/oclc/862298293
http://www.worldcat.org/oclc/865094197