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http://worldcat.org/entity/work/id/1724076039

AUTOTESTCON 2013 : "ATS Innovation in the Era of Challenging Budgets" : proceedings : Schaumburg Convention Center, September 16-19, 2013, Schaumburg, Illinois

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http://experiment.worldcat.org/entity/work/data/1724076039#Topic/automatic_test_equipment
http://experiment.worldcat.org/entity/work/data/1724076039#Topic/testing_data_processing
http://experiment.worldcat.org/entity/work/data/1724076039#Topic/automatic_test_equipment_congresses
http://experiment.worldcat.org/entity/work/data/1724076039#Topic/maintainability_engineering
http://experiment.worldcat.org/entity/work/data/1724076039#Topic/testing_data_processing_congresses
http://experiment.worldcat.org/entity/work/data/1724076039#Topic/maintainability_engineering_congresses

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"ATS Innovation in the Era of Challenging Budgets"@en
"2013 IEEE AUTOTESTCON proceedings"@en
"2013 IEEE AUTOTESTCON"@en
"AUTOTESTCON, 2013 IEEE"@en

http://schema.org/contributor

http://experiment.worldcat.org/entity/work/data/1724076039#Organization/ieee_aerospace_and_electronic_systems_society
http://experiment.worldcat.org/entity/work/data/1724076039#Organization/ieee_instrumentation_and_measurement_society
http://experiment.worldcat.org/entity/work/data/1724076039#Organization/institute_of_electrical_and_electronics_engineers

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http://experiment.worldcat.org/entity/work/data/1724076039#Meeting/autotestcon_2013_schaumburg_ill

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"AUTOTESTCON 2013 : "ATS Innovation in the Era of Challenging Budgets" : proceedings : Schaumburg Convention Center, September 16-19, 2013, Schaumburg, Illinois"@en

Autotestcon (2013 : Schaumburg, Ill.)

This is a placeholder reference for a Meeting entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
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"Autotestcon (2013 : Schaumburg, Ill.)"

http://experiment.worldcat.org/entity/work/data/1724076039#Meeting/autotestcon_2013_schaumburg_ill

IEEE Aerospace and Electronic Systems Society.

This is a placeholder reference for a Organization entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
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"IEEE Aerospace and Electronic Systems Society."

http://experiment.worldcat.org/entity/work/data/1724076039#Organization/ieee_aerospace_and_electronic_systems_society

IEEE Instrumentation and Measurement Society.

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"IEEE Instrumentation and Measurement Society."

http://experiment.worldcat.org/entity/work/data/1724076039#Organization/ieee_instrumentation_and_measurement_society

Institute of Electrical and Electronics Engineers,

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"Institute of Electrical and Electronics Engineers,"

http://experiment.worldcat.org/entity/work/data/1724076039#Organization/institute_of_electrical_and_electronics_engineers

Automatic test equipment.

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Automatic test equipment."

http://experiment.worldcat.org/entity/work/data/1724076039#Topic/automatic_test_equipment

Automatic test equipment Congresses.

rdf:type
http://schema.org/Topic
schema:name
"Automatic test equipment Congresses."

http://experiment.worldcat.org/entity/work/data/1724076039#Topic/automatic_test_equipment_congresses

Maintainability (Engineering)

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"Maintainability (Engineering)"

http://experiment.worldcat.org/entity/work/data/1724076039#Topic/maintainability_engineering

Maintainability (Engineering) Congresses.

rdf:type
http://schema.org/Topic
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"Maintainability (Engineering) Congresses."

http://experiment.worldcat.org/entity/work/data/1724076039#Topic/maintainability_engineering_congresses

Testing Data processing.

rdf:type
http://schema.org/Topic
schema:name
"Testing Data processing."

http://experiment.worldcat.org/entity/work/data/1724076039#Topic/testing_data_processing

Testing Data processing Congresses.

rdf:type
http://schema.org/Topic
schema:name
"Testing Data processing Congresses."

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http://worldcat.org/entity/work/id/1724076039

AUTOTESTCON 2013 : "ATS Innovation in the Era of Challenging Budgets" : proceedings : Schaumburg Convention Center, September 16-19, 2013, Schaumburg, Illinois

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