Linked Data Explorerhttp://worldcat.org/entity/work/id/1789617739
New approaches to image processing based failure analysis of nano-scale ULSI devices
New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise.
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http://schema.org/about
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/nanoelectronics
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/traitement_d_images_techniques_numeriques
- http://id.loc.gov/authorities/subjects/sh85084822
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/technology_&_engineering_mechanical
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/nano_electronics
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/nanoelectromechanical_systems_design_and_construction
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/signal_processing
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/nanotechnology
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/microelectronics
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/image_processing_digital_techniques
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/computers_and_it
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/traitement_du_signal
- http://id.worldcat.org/fast/1019757
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/image_processing
- http://id.worldcat.org/fast/1741867
- http://id.loc.gov/authorities/subjects/sh94000436
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/integrated_circuits_ultra_large_scale_integration
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/molecular_electronics
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/circuits_integres_a_ultra_grande_echelle
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/semiconductors
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/semiconducteurs
- http://experiment.worldcat.org/entity/work/data/1789617739#Topic/integrated_circuits_ultra_large_scale_integration_testing
- http://id.loc.gov/authorities/subjects/sh2006009047
- http://id.worldcat.org/fast/975599
http://schema.org/description
- "New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise."@en
- "This book introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. It presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization."@en
http://schema.org/genre
- "Livres électroniques"
- "Electronic books"
- "Electronic books"@en