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http://worldcat.org/entity/work/id/181120629

Scanning electron microscopy and x-ray microanalysis : analytical chemistry by open learning

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http://schema.org/about

http://schema.org/description

  • "SEM-instrumentation ; Operating conditions and limitations ; Specimen preparation ; Speciment characteristics ; Drying techniques ; Coating ; Cryo-SEM ; SEM X-Ray microanalysis - instrumentation ; Wavelength dispersive systems (WDS); Operating conditions and limitations; Data handling; Ohter surface analytical techniques; Self assessment questions and responses; Units of measurement."

http://schema.org/genre

  • "Matériel didactique"

http://schema.org/name

  • "Scanning electron microscopy and x-ray microanalysis : analytical chemistry by open learning"
  • "Scanning electron microscopy and x-ray microanalysis : analytical chemistry by open learning"@en
  • "Scanning electron microscopy and X-ray microanalysis"@en
  • "Scanning electron microscopy and X-ray microanalysis"
  • "Scanning electron microscopy and X-ray microanalysis : analytical chemistry by open learning"
  • "Scanning electron microscopy and x-ray microanalysis"
  • "Scanning electron microscopy and X-Ray microanalysis"