<http://experiment.worldcat.org/entity/work/data/1909669688.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/1909669688.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/1909669688> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/contributor> <http://viaf.org/viaf/123461004> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/creator> <http://id.loc.gov/authorities/names/n79076648> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/about> <http://id.worldcat.org/fast/822786> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/about> <http://id.loc.gov/authorities/names/n79076648> .
<http://worldcat.org/entity/work/id/1909669688> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/no97001081> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/about> <http://id.worldcat.org/fast/972696> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/about> <http://viaf.org/viaf/149517371> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/workExample> <http://www.worldcat.org/oclc/40505604> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/about> <http://id.worldcat.org/fast/534684> .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/name> "Technical reference model"@en .
<http://worldcat.org/entity/work/id/1909669688> <http://schema.org/creator> <http://viaf.org/viaf/149517371> .