Microelectronics failure analysis desk reference

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/CreativeWork
http://schema.org/Book

http://schema.org/about

http://experiment.worldcat.org/entity/work/data/1911150920#Topic/electronique_materiaux_essais_guides_manuels_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/electronic_apparatus_and_appliances_testing_handbooks_manuals_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/semiconductors_defects_handbooks_manuals_etc
http://id.worldcat.org/fast/1019774
http://id.loc.gov/authorities/subjects/sh85119908
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/microelectronics_materials_testing
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/electronique_materiaux_defauts_guides_manuels_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/microelectronics_materials_testing_handbooks_manuals_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/technology_&_engineering_electronics_microelectronics
http://id.worldcat.org/fast/1112211
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/semiconductors_defects
http://id.worldcat.org/fast/1019772
http://id.worldcat.org/fast/907564
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/microelectronics_materials_defects_handbooks_manuals_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/microelectronique_defauts_essais_guides_manuels_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/microelectronics_materials_defects
http://id.worldcat.org/fast/906837
http://id.loc.gov/authorities/subjects/sh85084822
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/appareils_electroniques_essais_guides_manuels_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/microelectronique_materiaux_essais_guides_manuels_etc
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/electronics_materials_testing
http://id.loc.gov/authorities/subjects/sh85042269
http://id.loc.gov/authorities/subjects/sh85042388
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/electronic_apparatus_and_appliances_testing
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/electronics_materials_testing_handbooks_manuals_etc
http://id.worldcat.org/fast/907571
http://experiment.worldcat.org/entity/work/data/1911150920#Topic/technology_&_engineering_electronics_digital

http://schema.org/alternateName

"Microelectronics failure analysis desk reference"@en

http://schema.org/contributor

http://worldcat.org/entity/person/id/2638084188
http://viaf.org/viaf/139315298
http://id.loc.gov/authorities/names/no99092286
http://viaf.org/viaf/149504957
http://id.loc.gov/authorities/names/n86066562

http://schema.org/creator

http://worldcat.org/entity/person/id/2638084188

http://schema.org/genre

"Handbooks and manuals"@en
"Handbooks and manuals"
"Electronic books"@en
"Electronic books"

http://schema.org/name

"Microelectronics failure analysis : desk reference / edited by Richard J. Ross ; EDFAS, ASM International"
"Microelectronics failure analysis desk reference"@en
"Microelectronics failure analysis desk reference"
"Microelectronics failure analysis : desk reference"

http://schema.org/workExample

http://www.worldcat.org/oclc/903622059
http://www.worldcat.org/oclc/701026679
http://www.worldcat.org/oclc/839827851
http://www.worldcat.org/oclc/801648795
http://www.worldcat.org/oclc/771901447
http://www.worldcat.org/oclc/897105089
http://www.worldcat.org/oclc/910946562
http://www.worldcat.org/oclc/840461181
http://www.worldcat.org/oclc/873905783

Appareils électroniques Essais Guides, manuels, etc.

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Appareils électroniques Essais Guides, manuels, etc."