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Measurement methods for the semiconductor device industry - a summary of NBS activity
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- http://id.loc.gov/authorities/names/n79071034
- http://id.loc.gov/authorities/names/n79021148
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- http://viaf.org/viaf/151862738
- http://experiment.worldcat.org/entity/work/data/1930269493#Organization/estados_unidos_national_bureau_of_standards
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- "Measurement methods for the semiconductor device industry - a summary of NBS activity"@en
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- "Measurement methods for the semiconductor device industry : a summary of NBS activity"
- "Measurement methods for the semiconductor device industry : A summary of NBS activity"