<http://experiment.worldcat.org/entity/work/data/198378074#Organization/rose_r_m> <http://schema.org/name> "Rose, R M" .
<http://experiment.worldcat.org/entity/work/data/198378074#Organization/rose_r_m> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Organization> .
<http://experiment.worldcat.org/entity/work/data/198378074.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/198378074.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/198378074> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/electronica_materials> <http://schema.org/name> "Electrònica Materials." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/electronica_materials> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Organization/john_wiley_&_sons> <http://schema.org/name> "John Wiley & Sons." .
<http://experiment.worldcat.org/entity/work/data/198378074#Organization/john_wiley_&_sons> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Organization> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materia_propiedades> <http://schema.org/name> "Materia Propiedades." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materia_propiedades> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/eletronica> <http://schema.org/name> "Eletronica." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/eletronica> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/matiere_proprietes> <http://schema.org/name> "Matière Propriétés." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/matiere_proprietes> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/werkstoff> <http://schema.org/name> "Werkstoff." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/werkstoff> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/elektrische_eigenschaft> <http://schema.org/name> "Elektrische Eigenschaft." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/elektrische_eigenschaft> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2629969534> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/802582206> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/689507793> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/198378074#Organization/rose_r_m> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/materia_propiedades> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/817008760> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/24399560> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/910464> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85082249> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Electronic properties : Robert M. Rose, Lawrence A. Shepard, John Wulff"@en .
<http://worldcat.org/entity/work/id/198378074> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/electronica_materials> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/electron_solids> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/253694734> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/matiere_proprietes> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2636526552> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/847117094> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/246000465> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/author> <http://worldcat.org/entity/person/id/2638873019> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/264204868> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/elektrische_eigenschaft> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2638873019> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/author> <http://worldcat.org/entity/person/id/2628608111> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Propiedades electrónicas" .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://id.worldcat.org/fast/1012463> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Propiedades electrónicas"@es .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2703467092> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/elektronika> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/912352637> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/252435775> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2628110209> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2633795790> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/eletronica> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2704168262> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/198378074#Organization/john_wiley_&_sons> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/semiconductores> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/249231170> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/217211898> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/316220020> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/werkstoff> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/assaigs_de_materials> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/841069060> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85082065> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/814441540> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/electronica_assaigs_de_materials> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/867960425> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/837533762> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/materiaux> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Electronic properties [by] Robert M. Rose, Lawrence A. Shepard [and] John Wulff"@en .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/474195682> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Electronic properties"@en .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Electronic properties" .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Electronic properties"@it .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://id.worldcat.org/fast/1011772> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2628608111> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/materiales_propiedades_electromagneticas> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/882835040> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2655060603> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2636526552> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/886520572> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85124647> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/conductividad_electrica> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/12474082> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/workExample> <http://www.worldcat.org/oclc/223355464> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/materialy> .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/name> "Electronic Properties" .
<http://worldcat.org/entity/work/id/198378074> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/198378074#Topic/ciencia_dos_materiais> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/conductividad_electrica> <http://schema.org/name> "Conductividad eléctrica." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/conductividad_electrica> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/assaigs_de_materials> <http://schema.org/name> "Assaigs de materials" .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/assaigs_de_materials> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materialy> <http://schema.org/name> "Materiały." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materialy> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/semiconductores> <http://schema.org/name> "Semiconductores." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/semiconductores> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/elektronika> <http://schema.org/name> "Elektronika." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/elektronika> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materiaux> <http://schema.org/name> "Matériaux." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materiaux> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/electron_solids> <http://schema.org/name> "Electron-Solids" .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/electron_solids> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materiales_propiedades_electromagneticas> <http://schema.org/name> "Materiales Propiedades electromagnéticas." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/materiales_propiedades_electromagneticas> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/ciencia_dos_materiais> <http://schema.org/name> "Ciencia dos materiais." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/ciencia_dos_materiais> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/electronica_assaigs_de_materials> <http://schema.org/name> "Electrònica Assaigs de materials." .
<http://experiment.worldcat.org/entity/work/data/198378074#Topic/electronica_assaigs_de_materials> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .