<http://experiment.worldcat.org/entity/work/data/2034210999.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/2034210999.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/2034210999> .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/halbleiterbauelement> <http://schema.org/name> "Halbleiterbauelement." .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/halbleiterbauelement> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/fertigung> <http://schema.org/name> "Fertigung" .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/fertigung> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/rasterelektronenmikroskopie_bildband> <http://schema.org/name> "Rasterelektronenmikroskopie Bildband." .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/rasterelektronenmikroskopie_bildband> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/2034210999#Topic/fertigung> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2686042407> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/workExample> <http://www.worldcat.org/oclc/884556080> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/workExample> <http://www.worldcat.org/oclc/174723737> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2686042407> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/author> <http://worldcat.org/entity/person/id/2686042407> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/2034210999#Topic/rasterelektronenmikroskopie> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/2034210999#Topic/rasterelektronenmikroskopie_bildband> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/2034210999#Topic/scanning_electron_microscopy> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/name> "Sehen heisst wissen : das Rasterelektronenmikroskop im Fehleranalyselabor" .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/name> "Sehen heißt wissen das Rasterelektronenmikroskop im Fehleranalyselabor" .
<http://worldcat.org/entity/work/id/2034210999> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/2034210999#Topic/halbleiterbauelement> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/workExample> <http://www.worldcat.org/oclc/889887660> .
<http://worldcat.org/entity/work/id/2034210999> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/2034210999#Topic/fehleranalyse> .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/fehleranalyse> <http://schema.org/name> "Fehleranalyse" .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/fehleranalyse> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/fehleranalyse> <http://schema.org/name> "Fehleranalyse." .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/scanning_electron_microscopy> <http://schema.org/name> "Scanning electron microscopy." .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/scanning_electron_microscopy> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/rasterelektronenmikroskopie> <http://schema.org/name> "Rasterelektronenmikroskopie" .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/rasterelektronenmikroskopie> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/2034210999#Topic/rasterelektronenmikroskopie> <http://schema.org/name> "Rasterelektronenmikroskopie." .