<http://worldcat.org/entity/work/id/20553503> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85076723> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/20553503#Topic/documentation_information_science_and_librarianship> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/contributor> <http://viaf.org/viaf/140641551> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/20553503#Topic/electrometry> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/workExample> <http://www.worldcat.org/oclc/59753117> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/contributor> <http://viaf.org/viaf/122865623> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/workExample> <http://www.worldcat.org/oclc/901950640> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/about> <http://id.worldcat.org/fast/997916> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2742749513> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/author> <http://worldcat.org/entity/person/id/2673844349> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n88219847> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/name> "International standards" .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/name> "International standards"@en .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/20553503#Topic/normalisatie> .
<http://worldcat.org/entity/work/id/20553503> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n80093455> .
<http://worldcat.org/entity/work/id/20553503> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://experiment.worldcat.org/entity/work/data/20553503#Topic/documentation_information_science_and_librarianship> <http://schema.org/name> "Documentation, information science and librarianship." .
<http://experiment.worldcat.org/entity/work/data/20553503#Topic/documentation_information_science_and_librarianship> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/20553503#Topic/normalisatie> <http://schema.org/name> "Normalisatie." .
<http://experiment.worldcat.org/entity/work/data/20553503#Topic/normalisatie> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/20553503#Topic/electrometry> <http://schema.org/name> "Electrometry." .
<http://experiment.worldcat.org/entity/work/data/20553503#Topic/electrometry> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/20553503.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/20553503.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/20553503> .