"Circuits and Systems." . . "Engineering." . . "Integrated circuits Very large scale integration Design and construction." . . "Ingénierie." . . . . "Ingénierie des systèmes." . . "TECHNOLOGY & ENGINEERING / Mechanical" . . "Computer science." . . "Debug Automation from Pre-Silicon to Post-Silicon" . . "Ressources Internet" . "Debug automation from pre-silicon to post-silicon"@en . . . . . . . . "Electronic books"@en . "Electronic books" . . . "This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs." . . . "This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs."@en . . . . . . . . . . . . . . . . . "Processor Architectures." . . "Systems engineering." . . "Informatique." . . "Fey, Gr̲schwin" . . "Dehbashi, Mehdi" . . "Electronic Circuits and Devices." . . "Electronic books." . . "Integrated circuits Very large scale integration Testing." . .