Linked Data Explorer

Turtle N-Triple JSON-LD RDF/XML HTML Contact Us Home

http://worldcat.org/entity/work/id/22467794

Hierarchical modeling for VLSI circuit testing

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/Book
http://schema.org/CreativeWork

http://schema.org/about

http://id.worldcat.org/fast/872078
http://id.worldcat.org/fast/975603
http://id.worldcat.org/fast/872451
http://id.worldcat.org/fast/975618
http://id.loc.gov/authorities/subjects/sh2009127319
http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuits_integres_a_tres_grande_echelle
http://id.loc.gov/authorities/subjects/sh89003285
http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuits_integres_a_tres_grande_echelle_simulation_par_ordinateur
http://id.worldcat.org/fast/872701
http://experiment.worldcat.org/entity/work/data/22467794#Topic/pruftechnik
http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuit_integre
http://experiment.worldcat.org/entity/work/data/22467794#Topic/simulation
http://id.loc.gov/authorities/subjects/sh85067125
http://experiment.worldcat.org/entity/work/data/22467794#Topic/vlsi
http://experiment.worldcat.org/entity/work/data/22467794#Topic/integrierte_schaltung
http://id.loc.gov/authorities/subjects/sh85029495
http://experiment.worldcat.org/entity/work/data/22467794#Topic/integrated_circuits
http://id.loc.gov/authorities/subjects/sh85029476
http://experiment.worldcat.org/entity/work/data/22467794#Topic/test
http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuits_integres_a_tres_grande_echelle_essais

http://schema.org/author

http://worldcat.org/entity/person/id/2640477654
http://worldcat.org/entity/person/id/2640628230

http://schema.org/contributor

http://worldcat.org/entity/person/id/2640628230
http://experiment.worldcat.org/entity/work/data/22467794#Thing/bhattacharya_debashis
http://worldcat.org/entity/person/id/2640477654
http://experiment.worldcat.org/entity/work/data/22467794#Thing/hayes_john_p

http://schema.org/creator

http://worldcat.org/entity/person/id/2640628230

http://schema.org/name

"Hierarchical modeling for VLSI circuit testing"@en
"Hierarchical modeling for VLSI circuit testing"
"Hierarchical Modeling for Vlsi Circuit Testing"@en
"Hierarchical Modeling for VLSI Circuit Testing"

http://schema.org/workExample

http://www.worldcat.org/oclc/831362559
http://www.worldcat.org/oclc/905466928
http://www.worldcat.org/oclc/636029551
http://www.worldcat.org/oclc/876746407
http://www.worldcat.org/oclc/645451485
http://www.worldcat.org/oclc/852791493
http://www.worldcat.org/oclc/861214385
http://www.worldcat.org/oclc/20629415
http://www.worldcat.org/oclc/869567987

Bhattacharya, Debashis

This is a placeholder reference for a Thing entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Thing
schema:name
"Bhattacharya, Debashis"

http://experiment.worldcat.org/entity/work/data/22467794#Thing/bhattacharya_debashis

Hayes, John P.

rdf:type
http://schema.org/Thing
schema:name
"Hayes, John P."

http://experiment.worldcat.org/entity/work/data/22467794#Thing/hayes_john_p

Circuit intégré

This is a placeholder reference for a Topic entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Topic
schema:name
"Circuit intégré"

http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuit_integre

Circuits intégrés à très grande échelle.

rdf:type
http://schema.org/Topic
schema:name
"Circuits intégrés à très grande échelle."

http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuits_integres_a_tres_grande_echelle

Circuits intégrés à très grande échelle Essais.

rdf:type
http://schema.org/Topic
schema:name
"Circuits intégrés à très grande échelle Essais."

http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuits_integres_a_tres_grande_echelle_essais

Circuits intégrés à très grande échelle Simulation par ordinateur.

rdf:type
http://schema.org/Topic
schema:name
"Circuits intégrés à très grande échelle Simulation par ordinateur."

http://experiment.worldcat.org/entity/work/data/22467794#Topic/circuits_integres_a_tres_grande_echelle_simulation_par_ordinateur

Integrated circuits.

rdf:type
http://schema.org/Topic
schema:name
"Integrated circuits."

http://experiment.worldcat.org/entity/work/data/22467794#Topic/integrated_circuits

Integrierte Schaltung.

rdf:type
http://schema.org/Topic
schema:name
"Integrierte Schaltung."

Linked Data Explorer

Turtle N-Triple JSON-LD RDF/XML HTML Contact Us Home

http://worldcat.org/entity/work/id/22467794

Hierarchical modeling for VLSI circuit testing

Open All Close All

type

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

about

http://schema.org/about

author

http://schema.org/author

contributor

http://schema.org/contributor

creator

http://schema.org/creator

genre

http://schema.org/genre

name

http://schema.org/name

workExample

http://schema.org/workExample