<http://experiment.worldcat.org/entity/work/data/24705019.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/24705019.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/24705019> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2628950975> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n80126316> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/about> <http://id.worldcat.org/fast/1106581> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/name> "Material parameter determination from scattering measurements"@en .
<http://worldcat.org/entity/work/id/24705019> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/24705019> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/workExample> <http://www.worldcat.org/oclc/22897451> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85097853> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/about> <http://id.worldcat.org/fast/1052990> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2678120875> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2628737144> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85118047> .
<http://worldcat.org/entity/work/id/24705019> <http://schema.org/contributor> <http://viaf.org/viaf/155061179> .