Testability of electronic circuits

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/CreativeWork

http://schema.org/about

http://id.worldcat.org/fast/893685
http://id.loc.gov/authorities/subjects/sh85042282
http://id.worldcat.org/fast/906898
http://experiment.worldcat.org/entity/work/data/25121565#Topic/electronic_circuit_design
http://experiment.worldcat.org/entity/work/data/25121565#Topic/testbarkeit
http://experiment.worldcat.org/entity/work/data/25121565#Topic/cad
http://id.loc.gov/authorities/subjects/sh85042276
http://experiment.worldcat.org/entity/work/data/25121565#Topic/elektronische_schaltung
http://experiment.worldcat.org/entity/work/data/25121565#Topic/circuits_electronics_disseny
http://experiment.worldcat.org/entity/work/data/25121565#Topic/schemas_electroniques
http://experiment.worldcat.org/entity/work/data/25121565#Topic/prufung
http://experiment.worldcat.org/entity/work/data/25121565#Topic/pruftechnik
http://experiment.worldcat.org/entity/work/data/25121565#Topic/test
http://experiment.worldcat.org/entity/work/data/25121565#Topic/electronic_circuits_testing
http://experiment.worldcat.org/entity/work/data/25121565#Topic/circuits_electronics_proves
http://id.worldcat.org/fast/906862
http://experiment.worldcat.org/entity/work/data/25121565#Topic/digital_electronics_testing
http://id.loc.gov/authorities/subjects/sh85037976
http://experiment.worldcat.org/entity/work/data/25121565#Topic/circuits_electroniques_essais
http://experiment.worldcat.org/entity/work/data/25121565#Topic/electronique_numerique_essais
http://experiment.worldcat.org/entity/work/data/25121565#Topic/computerunterstutztes_verfahren

http://schema.org/author

http://worldcat.org/entity/person/id/2642541720
http://worldcat.org/entity/person/id/2642468928

http://schema.org/contributor

http://worldcat.org/entity/person/id/2672054579
http://worldcat.org/entity/person/id/2642934634
http://worldcat.org/entity/person/id/2668310422
http://worldcat.org/entity/person/id/2642541720

http://schema.org/creator

http://worldcat.org/entity/person/id/2642468928

http://schema.org/name

"Testability of electronic circuits"
"Testability of electronic circuits"@en

http://schema.org/workExample

http://www.worldcat.org/oclc/722200826
http://www.worldcat.org/oclc/844985707
http://www.worldcat.org/oclc/746907237
http://www.worldcat.org/oclc/24066964
http://www.worldcat.org/oclc/26355393
http://www.worldcat.org/oclc/468455526
http://www.worldcat.org/oclc/639809495
http://www.worldcat.org/oclc/473063582
http://www.worldcat.org/oclc/803037231

CAD

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rdf:type
http://schema.org/Topic
schema:name
"CAD"