<http://experiment.worldcat.org/entity/work/data/2517428664.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/2517428664.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/2517428664> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n77012267> .
<http://worldcat.org/entity/work/id/2517428664> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/about> <http://viaf.org/viaf/127098291> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85093092> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/workExample> <http://www.worldcat.org/oclc/665731516> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/about> <http://id.loc.gov/authorities/names/no2010156284> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/name> "Criticality monitoring system degradation at BWX Technologies, Inc., Nuclear Products Division, Lynchburg, VA" .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/contributor> <http://viaf.org/viaf/132498999> .
<http://worldcat.org/entity/work/id/2517428664> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/contributor> <http://viaf.org/viaf/128766359> .
<http://worldcat.org/entity/work/id/2517428664> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n77011869> .