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http://worldcat.org/entity/work/id/26142905

High resolution x-ray scattering from thin films and multilayers

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

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  • "High resolution x-ray scattering from thin films and multilayers"

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  • "This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis."@en

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  • "Electronic books"@en

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  • "High-Resolution X-Ray Scattering from Thin Films and Multilayers"
  • "High-resolution X-ray scattering : from thin films and multilayers"
  • "High resolution x-ray scattering from thin films and multilayers"
  • "High resolution x-ray scattering from thin films and multilayers"@en
  • "High-resolution X-ray scattering from thin films and multilayers"@en
  • "High-resolution X-ray scattering from thin films and multilayers"
  • "High-resolution x-ray scattering from thin films and multilayers"

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