<http://worldcat.org/entity/work/id/2799000> <http://schema.org/name> "Production-compatible microelectronic test structures for the measurement of interface state density and neutral trap density"@en .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85041606> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n81037634> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/contributor> <http://viaf.org/viaf/156559905> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/workExample> <http://www.worldcat.org/oclc/86045347> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/about> <http://id.worldcat.org/fast/904526> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79096705> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/workExample> <http://www.worldcat.org/oclc/9528296> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79021148> .
<http://worldcat.org/entity/work/id/2799000> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/contributor> <http://viaf.org/viaf/130175020> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/about> <http://id.worldcat.org/fast/1019757> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/about> <http://id.worldcat.org/fast/1049577> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/workExample> <http://www.worldcat.org/oclc/711633473> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2638421817> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/workExample> <http://www.worldcat.org/oclc/10253515> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85084822> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/contributor> <http://viaf.org/viaf/126653902> .
<http://worldcat.org/entity/work/id/2799000> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85096315> .
<http://worldcat.org/entity/work/id/2799000> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://experiment.worldcat.org/entity/work/data/2799000.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/2799000.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/2799000> .