Linked Data Explorerhttp://worldcat.org/entity/work/id/2868482
Design of systems and circuits for maximum reliability or maximum production yield
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http://schema.org/about
- http://id.worldcat.org/fast/907487
- http://id.worldcat.org/fast/906827
- http://id.loc.gov/authorities/subjects/sh85042373
- http://id.loc.gov/authorities/subjects/sh85042256
- http://id.loc.gov/authorities/subjects/sh85042276
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/electronique_materiaux
- http://id.worldcat.org/fast/906866
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/elektrotechniek
- http://id.worldcat.org/fast/906788
- http://id.worldcat.org/fast/906787
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/electronica_aparatos_y_accesorios_fiabilidad_procesamiento_de_datos
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/processament_de_dades
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/sistemas_electronicos_diseno_y_construccion_procesamiento_de_datos
- http://id.worldcat.org/fast/906862
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/zuverlassigkeitstheorie
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/circuits_electroniques
- http://id.loc.gov/authorities/subjects/sh85042266
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/optimizacion_estructural
- http://id.loc.gov/authorities/subjects/sh85042278
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/appareils_electroniques
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/diseno_de_circuitos_electronicos_procesamiento_de_datos
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/electricitat
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/fiabilidad_ingenieria_metodos_estadisticos
- http://experiment.worldcat.org/entity/work/data/2868482#Topic/onderdelen
- http://id.worldcat.org/fast/906829
http://schema.org/alternateName
- "Design of systems and circuits"
http://schema.org/contributor
- http://experiment.worldcat.org/entity/work/data/2868482#Organization/ek
- http://experiment.worldcat.org/entity/work/data/2868482#Organization/lyngby_technical_university_of_denmark_electronics_laboratory
- http://worldcat.org/entity/person/id/2632331611
- http://experiment.worldcat.org/entity/work/data/2868482#Organization/dth
- http://worldcat.org/entity/person/id/2661861145
- http://worldcat.org/entity/person/id/2698685417
- http://worldcat.org/entity/person/id/2631836140
http://schema.org/name
- "Design of systems and circuits"
- "Design of systems and circuits for maximum reliability or maximum production yield : preliminary ed"
- "Design of systems and circuits : for maximum reliability or maximum production yield"
- "Design of systems and circuits for maximum reliability or maximum production yield / [Kbh.]: Technical University of Denmark"
- "Design of systems and circuits for maximum reliabity or maximum production yield"
- "Design of systems and circuits for maximum reliability or maximum production Yield"
- "Design of systems and circuits for maximum reliability or maximum production yield"@en
- "Design of systems and circuits for maximum reliability or maximum production yield"
- "Design of systems and circuits for maximum reliability or maximum production yield"@da
- "Design of systems and circuits: for maximum reliability or maximum production yield"
- "Design of systems and circuits for maximum reliability or maximum production yield : Preliminary ed"@da
http://schema.org/workExample
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