<http://experiment.worldcat.org/entity/work/data/30647248.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/30647248.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/30647248> .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/workExample> <http://www.worldcat.org/oclc/297307113> .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/about> <http://id.worldcat.org/fast/1019774> .
<http://worldcat.org/entity/work/id/30647248> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Periodical_literature> .
<http://worldcat.org/entity/work/id/30647248> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/genre> "Conference papers and proceedings"@en .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/workExample> <http://www.worldcat.org/oclc/28372542> .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/genre> "Conference proceedings"@en .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/about> <http://id.worldcat.org/fast/1019778> .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/name> "Materials reliability in microelectronics symposium held"@en .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/workExample> <http://www.worldcat.org/oclc/643780222> .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/name> "Materials reliability in microelectronics : symposium held"@en .
<http://worldcat.org/entity/work/id/30647248> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85084822> .