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Instrumentation, metrology, and standards for nanomanufacturing III : 3-5 August 2009, San Diego, California, United States
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- http://id.loc.gov/authorities/subjects/sh93000864
- http://id.worldcat.org/fast/1019807
- http://id.worldcat.org/fast/1894718
- http://id.loc.gov/authorities/subjects/sh91001490
- http://id.loc.gov/authorities/subjects/sh2010101677
- http://id.worldcat.org/fast/1032630
- http://id.loc.gov/authorities/subjects/sh96011316
- http://id.worldcat.org/fast/1032639
- http://id.loc.gov/authorities/subjects/sh2008108196
- http://id.loc.gov/authorities/subjects/sh2011004498
- http://id.loc.gov/authorities/subjects/sh2008108194
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- http://id.loc.gov/authorities/names/n88112126
- http://id.loc.gov/authorities/names/no2007109252
- http://experiment.worldcat.org/entity/work/data/323144121#Organization/spie
- http://viaf.org/viaf/131110795
- http://worldcat.org/entity/person/id/2641587944
- http://experiment.worldcat.org/entity/work/data/323144121#Organization/society_of_photo_optical_instrumentation_engineers_united_states
- http://worldcat.org/entity/person/id/2634744475
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- "Conference papers and proceedings"@en
- "Conference papers and proceedings"
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- "Instrumentation, metrology, and standards for nanomanufacturing III : 3-5 August 2009, San Diego, California, United States"@en
- "Instrumentation, metrology, and standards for nanomanufacturing III : 3-5 August 2009, San Diego, California, United States"
- "Instrumentation, metrology, and standards for nanomanufacturing III 3-5 August 2009, San Diego, California, United States"@en
- "Instrumentation, metrology, and standards for nanomanufacturing III 3-5 August 2009, San Diego, California, United States"