<http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_nov_2000_upton> <http://schema.org/name> "International Symposium on Electron Beam Ion Sources and Traps and their Applications (8th : Nov. 2000 : Upton,)" .
<http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_nov_2000_upton> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_nov_2000_upton> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .
<http://experiment.worldcat.org/entity/work/data/323242539.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/323242539.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/323242539> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/contributor> <http://viaf.org/viaf/150484606> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/323242539#Topic/faisceaux_electroniques_congres> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/workExample> <http://www.worldcat.org/oclc/840370218> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/name> "Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000" .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/name> "Electron Beam Ion Sources and Traps and their Applications, 8th International Symposium, EBIS" .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85042200> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/323242539#Topic/sources_d_ions_congres> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/name> "Electron beam ion sources and traps and their applications 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000"@en .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/workExample> <http://www.worldcat.org/oclc/71225202> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/workExample> <http://www.worldcat.org/oclc/47927783> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/contributor> <http://worldcat.org/entity/person/id/2636653744> .
<http://worldcat.org/entity/work/id/323242539> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/contributor> <http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_nov_2000_upton> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/creator> <http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_2000_upton_n_y> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/about> <http://id.worldcat.org/fast/906654> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh2008119291> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/about> <http://id.worldcat.org/fast/978602> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/genre> "Conference papers and proceedings"@en .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85067808> .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/genre> "Conference papers and proceedings" .
<http://worldcat.org/entity/work/id/323242539> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n79078128> .
<http://worldcat.org/entity/work/id/323242539> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://experiment.worldcat.org/entity/work/data/323242539#Topic/faisceaux_electroniques_congres> <http://schema.org/name> "Faisceaux électroniques Congrès." .
<http://experiment.worldcat.org/entity/work/data/323242539#Topic/faisceaux_electroniques_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/323242539#Topic/sources_d_ions_congres> <http://schema.org/name> "Sources d'ions Congrès." .
<http://experiment.worldcat.org/entity/work/data/323242539#Topic/sources_d_ions_congres> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Topic> .
<http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_2000_upton_n_y> <http://schema.org/name> "International Symposium on Electron Beam Ion Sources and Traps and their Applications (8th : 2000 : Upton, N.Y.)" .
<http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_2000_upton_n_y> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Meeting> .
<http://experiment.worldcat.org/entity/work/data/323242539#Meeting/international_symposium_on_electron_beam_ion_sources_and_traps_and_their_applications_8th_2000_upton_n_y> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Event> .