<http://experiment.worldcat.org/entity/work/data/34312479.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/34312479.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/34312479> .
<http://worldcat.org/entity/work/id/34312479> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/Book> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/about> <http://id.worldcat.org/fast/967605> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/contributor> <http://id.loc.gov/authorities/names/n78087581> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/name> "Method for advanced material characterization by laser induced eddy current imaging"@en .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85064471> .
<http://worldcat.org/entity/work/id/34312479> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85040943> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/about> <http://id.worldcat.org/fast/902410> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/workExample> <http://www.worldcat.org/oclc/31682169> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2670688804> .
<http://worldcat.org/entity/work/id/34312479> <http://schema.org/contributor> <http://viaf.org/viaf/146202023> .