"Mikroskopia elektronowa." . . "Elektronenmikroskopie Hochauflösendes Verfahren." . . "Elektronenmikroskopie." . . "Characterization and Evaluation of Materials." . . "Zairyōshiken." . . "材料試験" . "Surfaces (Physics)" . . . . "Werkstoff Elektronenmikroskopie." . . "Elektronenmikroskopie Werkstoff." . . "Matériaux Microscopie." . . "Microscopie électronique." . . "Materials Science." . . "HREM." . . "Materiały mikroskopia." . . "Hochauflösendes Verfahren." . . "Denshikenbikyō." . . "電子顕微鏡" . "Measurement Science and Instrumentation." . . . . . "High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM."@en . "High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM." . . "Zairyō hyōka no tame no kōbunkainō denshi kenbikyōhō" . . . "High resolution electron microscopy for materials science" . . . . . "材料評価のための高分解能電子顕微鏡法" . . . . . "Zairyō hyōka no tameno kōbunkainō denshi kenbikyōhō"@ja . . . . . . . . . . . . . . . . "High-resolution electron microscopy for materials science"@en . "High-resolution electron microscopy for materials science" . . . . . . "High-Resolution Electron Microscopy for Materials Science"@en . "High-Resolution Electron Microscopy for Materials Science" . . "Electronic books" . . . . . . . . "Elektronenmicroscopie." . .