<http://worldcat.org/entity/work/id/36251925> <http://schema.org/creator> <http://worldcat.org/entity/person/id/2733385976> .
<http://worldcat.org/entity/work/id/36251925> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://schema.org/CreativeWork> .
<http://worldcat.org/entity/work/id/36251925> <http://www.w3.org/1999/02/22-rdf-syntax-ns#type> <http://www.productontology.org/id/Thesis> .
<http://worldcat.org/entity/work/id/36251925> <http://schema.org/workExample> <http://www.worldcat.org/oclc/47169630> .
<http://worldcat.org/entity/work/id/36251925> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85067117> .
<http://worldcat.org/entity/work/id/36251925> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh85067827> .
<http://worldcat.org/entity/work/id/36251925> <http://schema.org/about> <http://id.worldcat.org/fast/975535> .
<http://worldcat.org/entity/work/id/36251925> <http://schema.org/about> <http://id.worldcat.org/fast/978640> .
<http://worldcat.org/entity/work/id/36251925> <http://schema.org/name> "Charge collection studies on integrated circuit test structures using heavy-ion microbeams and MEDICI simulation calculations"@en .
<http://experiment.worldcat.org/entity/work/data/36251925.nt> <http://rdfs.org/ns/void#inDataset> <http://purl.oclc.org/dataset/WorldCat/Works> .
<http://experiment.worldcat.org/entity/work/data/36251925.nt> <http://schema.org/about> <http://worldcat.org/entity/work/id/36251925> .