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ARPA/NBS workshop III : test patterns for integrated circuits
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http://schema.org/about
- http://id.loc.gov/authorities/subjects/sh85042337
- http://experiment.worldcat.org/entity/work/data/365453039#Topic/industrie_electronique_qualite_controle_congres
- http://id.worldcat.org/fast/907274
- http://id.worldcat.org/fast/822733
- http://experiment.worldcat.org/entity/work/data/365453039#Topic/circuits_integres_essais_congres
- http://id.loc.gov/authorities/subjects/sh2008104739
- http://id.worldcat.org/fast/975593
- http://id.loc.gov/authorities/subjects/sh2009116427
http://schema.org/alternateName
- "Test Patterns for Integrated Circuits"
http://schema.org/name
- "ARPA/NBS Workshop III: Test Patterns for Integrated Circuits : [Scottsdale, Ariz., September 6, 1974 : final report]"
- "ARPA/NBS workshop III : test patterns for integrated circuits"@en
- "ARPA/NBS workshop III : test patterns for integrated circuits"
- "ARPA/NBS workshop III test patterns for integrated circuits"@en