Microelectronic yield, reliability, and advanced packaging 28-30 November 2000, Singapore

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Conference (2000.11.28-30 Singapore)

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Nanyang Technological University

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Society of Photo-Optical Instrumentation Engineers.

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Society of Photo-optical Instrumentation Engineers (United States)

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SPIE Digital Library.

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Microsystèmes électromécaniques Fiabilité Congrès.

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Mise sous boîtier (Microélectronique) Congrès.

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