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http://worldcat.org/entity/work/id/3923390

Assuring the integrity of multilayer substrates prior to assembly

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type

http://www.w3.org/1999/02/22-rdf-syntax-ns#type

http://schema.org/CreativeWork
http://schema.org/Book

about

http://schema.org/about

http://id.worldcat.org/fast/1149980
http://id.loc.gov/authorities/subjects/sh85134848
http://id.worldcat.org/fast/1149983
http://id.loc.gov/authorities/subjects/sh85134846

contributor

http://schema.org/contributor

http://experiment.worldcat.org/entity/work/data/3923390#Organization/international_society_for_hybrid_microelectronics_multilayer_testing_technology_committee

creator

http://schema.org/creator

http://worldcat.org/entity/person/id/2646819105

name

http://schema.org/name

"Assuring the integrity of multilayer substrates prior to assembly"@en

workExample

http://schema.org/workExample

http://www.worldcat.org/oclc/663739988
http://www.worldcat.org/oclc/11424140

International Society for Hybrid Microelectronics. Multilayer Testing Technology Committee.

This is a placeholder reference for a Organization entity, related to a WorldCat Entity. Over time, these references will be replaced with persistent URIs to VIAF, FAST, WorldCat, and other Linked Data resources.

rdf:type
http://schema.org/Organization
schema:name
"International Society for Hybrid Microelectronics. Multilayer Testing Technology Committee."

http://experiment.worldcat.org/entity/work/data/3923390#Organization/international_society_for_hybrid_microelectronics_multilayer_testing_technology_committee

This information is contained in the WorldCat Entities dataset, which is made available under the ODC Attribution license.