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<http://worldcat.org/entity/work/id/411047> <http://schema.org/about> <http://id.worldcat.org/fast/906802> .
<http://worldcat.org/entity/work/id/411047> <http://schema.org/name> "Reparación de equipos de estado sólido" .
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<http://worldcat.org/entity/work/id/411047> <http://schema.org/workExample> <http://www.worldcat.org/oclc/841091158> .
<http://worldcat.org/entity/work/id/411047> <http://schema.org/workExample> <http://www.worldcat.org/oclc/841162264> .
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<http://worldcat.org/entity/work/id/411047> <http://schema.org/workExample> <http://www.worldcat.org/oclc/475052781> .
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<http://worldcat.org/entity/work/id/411047> <http://schema.org/name> "Handbook of practical solid-state troubleshooting"@en .
<http://worldcat.org/entity/work/id/411047> <http://schema.org/name> "Reparacíon de equipos de estado solido" .
<http://worldcat.org/entity/work/id/411047> <http://schema.org/name> "Handbook of practical solid-state troubleshooting" .
<http://worldcat.org/entity/work/id/411047> <http://schema.org/name> "Handbook of practical solid-state troubleshooting : Shows howto service the solid"@en .
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<http://worldcat.org/entity/work/id/411047> <http://schema.org/description> "For Technicians and engineers." .
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<http://worldcat.org/entity/work/id/411047> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/411047#Topic/appareils_electroniques_entretien_et_reparations> .
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<http://worldcat.org/entity/work/id/411047> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/411047#Topic/fehleranalyse> .
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<http://worldcat.org/entity/work/id/411047> <http://schema.org/about> <http://experiment.worldcat.org/entity/work/data/411047#Topic/integrierte_schaltung> .
<http://worldcat.org/entity/work/id/411047> <http://schema.org/workExample> <http://www.worldcat.org/oclc/630664381> .
<http://worldcat.org/entity/work/id/411047> <http://schema.org/workExample> <http://www.worldcat.org/oclc/847770699> .
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<http://experiment.worldcat.org/entity/work/data/411047#Topic/halbleiter> <http://schema.org/name> "Halbleiter." .
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