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Fast risetime reverse bias pulse failures in SiC PN junction diodes
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- http://experiment.worldcat.org/entity/work/data/41926168#Topic/bias
- http://id.loc.gov/authorities/subjects/sh85122519
- http://id.worldcat.org/fast/1112198
- http://id.loc.gov/authorities/subjects/sh85119903
- http://experiment.worldcat.org/entity/work/data/41926168#Topic/p_n_junctions
- http://id.worldcat.org/fast/1118657
- http://experiment.worldcat.org/entity/work/data/41926168#Topic/silicon_carbides
- http://id.loc.gov/authorities/subjects/sh85038376
- http://id.worldcat.org/fast/894985
- http://experiment.worldcat.org/entity/work/data/41926168#Topic/semiconductors_materials
- http://experiment.worldcat.org/entity/work/data/41926168#Topic/doped_crystals
- http://experiment.worldcat.org/entity/work/data/41926168#Topic/energy_gaps_solid_state
- http://experiment.worldcat.org/entity/work/data/41926168#Topic/high_temperature_environments
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- "Fast risetime reverse bias pulse failures in SiC PN junction diodes"@en