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<http://worldcat.org/entity/work/id/45118241> <http://schema.org/about> <http://id.loc.gov/authorities/subjects/sh92001586> .
<http://worldcat.org/entity/work/id/45118241> <http://schema.org/about> <http://id.worldcat.org/fast/1106485> .
<http://worldcat.org/entity/work/id/45118241> <http://schema.org/name> "Quantitative, non-destructive calibration of scanned probe microscope cantilevers"@en .
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