Linked Data Explorerhttp://worldcat.org/entity/work/id/478187326
Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland
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http://schema.org/about
- http://experiment.worldcat.org/entity/work/data/478187326#Topic/controle_non_destructif_congres
- http://id.loc.gov/authorities/subjects/sh2008108676
- http://id.worldcat.org/fast/1715944
- http://id.loc.gov/authorities/subjects/sh2008107149
- http://id.worldcat.org/fast/998476
- http://id.loc.gov/authorities/subjects/sh85083608
- http://experiment.worldcat.org/entity/work/data/478187326#Topic/detecteurs_optiques_congres
- http://experiment.worldcat.org/entity/work/data/478187326#Topic/mesures_optiques_congres
- http://id.loc.gov/authorities/subjects/sh85104156
- http://id.loc.gov/authorities/subjects/sh85095144
- http://id.worldcat.org/fast/1068305
- http://experiment.worldcat.org/entity/work/data/478187326#Topic/polarisation_lumiere_congres
- http://id.loc.gov/authorities/subjects/sh2008108670
- http://id.worldcat.org/fast/1046682
- http://experiment.worldcat.org/entity/work/data/478187326#Topic/mesure_congres
- http://id.loc.gov/authorities/subjects/sh85076871
- http://id.loc.gov/authorities/subjects/sh85095156
- http://id.worldcat.org/fast/1046776
http://schema.org/alternateName
- "Metrology, spectroscopy, and testing techniques using light"
- "Metrology, spectroscopy, and testing techniques using light"@en
http://schema.org/contributor
- http://worldcat.org/entity/person/id/2630604684
- http://viaf.org/viaf/122810546
- http://id.loc.gov/authorities/names/n96054377
- http://experiment.worldcat.org/entity/work/data/478187326#Organization/komitet_badan_naukowych_pologne
- http://experiment.worldcat.org/entity/work/data/478187326#Organization/spie_digital_library
- http://viaf.org/viaf/140608958
- http://experiment.worldcat.org/entity/work/data/478187326#Organization/society_of_photo_optical_instrumentation_engineers_united_states_poland_chapter
- http://viaf.org/viaf/156972271
- http://viaf.org/viaf/124178567
- http://experiment.worldcat.org/entity/work/data/478187326#Organization/society_of_photo_optical_instrumentation_engineers_united_states
- http://id.loc.gov/authorities/names/nr93050346
- http://experiment.worldcat.org/entity/work/data/478187326#Organization/komitet_bada_naukowych_poland
- http://viaf.org/viaf/129711063
- http://experiment.worldcat.org/entity/work/data/478187326#Meeting/l_metry_lm_conference_2000_06_05_08_pultusk
- http://worldcat.org/entity/person/id/2628492162
- http://experiment.worldcat.org/entity/work/data/478187326#Organization/society_of_photo_optical_instrumentation_engineers
- http://worldcat.org/entity/person/id/2639799416
- http://id.loc.gov/authorities/names/n93040767
http://schema.org/genre
- "Conference papers and proceedings"
- "Conference papers and proceedings"@en
http://schema.org/name
- "Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland"
- "Lightmetry : metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland"@en
- "Lightmetry : metrology, spectroscopy, and testing techniques using light"
- "Lightmetry : metrology: spectroscopy, and testing techniques using light"
- "Lightmetry metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland"
- "Lightmetry metrology, spectroscopy, and testing techniques using light : 5-8 June 2000, Pultusk, Poland"@en
http://schema.org/workExample
- http://www.worldcat.org/oclc/436975455
- http://www.worldcat.org/oclc/849904879
- http://www.worldcat.org/oclc/841342387
- http://www.worldcat.org/oclc/890245874
- http://www.worldcat.org/oclc/48157326
- http://www.worldcat.org/oclc/53836609
- http://www.worldcat.org/oclc/248466037
- http://www.worldcat.org/oclc/496226312
- http://www.worldcat.org/oclc/759718649